Wavelength-modulated heterodyne speckle interferometry for displacement measurement

Ju Yi Lee, Kun Yi Lin, Szu Han Huang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

2 引文 斯高帕斯(Scopus)

摘要

A heterodyne speckle interferometry for measurement of in-plane displacement is proposed. The wavelength-modulated (WM) laser beam passing through an unequal-path-length optical configuration is used as a heterodyne light source. The scattering heterodyne speckle signal is received by letting the WM heterodyne light incidents on the in-plane moving rough surface. The object displacement would be determined by the speckle interferometry theorem with the measured phase variation of the heterodyne speckle signal. The experimental results demonstrate that the measurement range is up to 10 μm and resolution is about 10 nm.

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主出版物標題Optical Measurement Systems for Industrial Inspection VI
DOIs
出版狀態已出版 - 2009
事件Optical Measurement Systems for Industrial Inspection VI - Munich, Germany
持續時間: 15 6月 200918 6月 2009

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7389
ISSN(列印)0277-786X

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???event.eventtypes.event.conference???Optical Measurement Systems for Industrial Inspection VI
國家/地區Germany
城市Munich
期間15/06/0918/06/09

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