Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

Ken Chau Cheung Cheng, Katherine Shu-Min Li, Andrew Yi Ann Huang, Ji Wei Li, Leon Li Yang Chen, Nova Cheng-Yen Tsai, Sying Jyan Wang, Chen Shiun Lee, Leon Chou, Peter Yi Yu Liao, Hsing Chung Liang, Jwu E. Chen