Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis

Ken Chau Cheung Cheng, Katherine Shu-Min Li, Andrew Yi Ann Huang, Ji Wei Li, Leon Li Yang Chen, Nova Cheng-Yen Tsai, Sying Jyan Wang, Chen Shiun Lee, Leon Chou, Peter Yi Yu Liao, Hsing Chung Liang, Jwu E. Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

4 引文 斯高帕斯(Scopus)

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Mathematics

Engineering & Materials Science