VirtualGC: Enabling Erase-free Garbage Collection to Upgrade the Performance of Rewritable SLC NAND Flash Memory

Tseng Yi Chen, Yuan Hao Chang, Yuan Hung Kuan, Yu Ming Chang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

8 引文 斯高帕斯(Scopus)

摘要

Since 3D NAND flash memory could provide more reliable storage than a 2D planar flash memory by relaxing the design rule of a memory cell, a kind of brand new programming technique, namely erase-free scheme, has been proposed to further enhance the endurance of a 3D SLC NAND flash memory. The erase-free scheme brings tons of benefits to flash memory performance and endurance. For example, the erase-free scheme could reclaim invalid (page) space without physically erasing a flash block. However, current flash management designs could not fully exploit the benefits of the erase-free scheme. With the considerations of the features of the erase-free scheme, this paper is the first work to propose a novel flash management design, namely VirtualGC strategy, to deal with the erase-free garbage collection process. By taking the advantages of the erase-free scheme, the proposed strategy reduces the overhead of copying live pages so as to increase flash memory performance. The results show that the proposed strategy significantly improves the performance of rewritable 3D flash memory drives.

原文???core.languages.en_GB???
主出版物標題Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781450349277
DOIs
出版狀態已出版 - 18 6月 2017
事件54th Annual Design Automation Conference, DAC 2017 - Austin, United States
持續時間: 18 6月 201722 6月 2017

出版系列

名字Proceedings - Design Automation Conference
Part 128280
ISSN(列印)0738-100X

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???event.eventtypes.event.conference???54th Annual Design Automation Conference, DAC 2017
國家/地區United States
城市Austin
期間18/06/1722/06/17

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