Due to the pin-count limitation, built-in self-diagnosis (BISD) for embedded RAMs usually exports diagnosis information serially, which results in the overhead of diagnostic time. This paper describes a tree-based compression technique for word-oriented memories. The technique can speed up the transmission of diagnosis data from the embedded RAM with BISD support. By using a simplified Huffman coding scheme and partitioning each 256-bit Hamming syndrome into fixed-size symbols, the average compression ratio is reduced to about 10%, assuming 16-bit symbols. The proposed compression technique reduces the time for diagnostic test, as well as the tester storage requirement.
|出版狀態||已出版 - 2001|
|事件||2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings - Hsinchu, Taiwan|
持續時間: 18 4月 2001 → 20 4月 2001
|???event.eventtypes.event.conference???||2001 International Symposium on VLSI Technology, Systems, and Applications, Proceedings|
|期間||18/04/01 → 20/04/01|