Using moire method of measuring optical disks

Ter Chin Cheng, Sheng Nan Jiang, Rong Seng Chang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

A primary function of compact disk measuring systems is the measurement of various types of defects which represent either functional or cosmetic flaws and the measurement of the profile of the compact disk. Functional flaws can make a very bad interference with the reproduction of the recorded music. Cosmetic flaws are visual imperfections whose presence can cause the rejecting of the disc by the production line. A projection moire method is invented in which a light beam passes through a grating, and is projected onto the object by overlapping with the virtual grating in the computer software. The object's 3-dimensional profile will be reconstructed and the object's profile quality can be improved by our new method for moire image processing.

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主出版物標題Proceedings of SPIE - The International Society for Optical Engineering
發行者Publ by Int Soc for Optical Engineering
頁面95-101
頁數7
ISBN(列印)0819409251
出版狀態已出版 - 1992
事件Current Developments in Optical Design and Optical Engineering II - San Diego, CA, USA
持續時間: 20 7月 199221 7月 1992

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
1752
ISSN(列印)0277-786X

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???event.eventtypes.event.conference???Current Developments in Optical Design and Optical Engineering II
城市San Diego, CA, USA
期間20/07/9221/07/92

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