TY - GEN
T1 - Using Deep Attention Networks to Extract Defects in Crisscross Background
AU - Hsu, Chen Tao
AU - Lee, Yi Shan
AU - Chuang, Jen Hui
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/12
Y1 - 2020/12
N2 - Nowadays, automatic optical inspection (AOI) has been widely used in advanced manufactory. In AOI area, crisscross background may influence extraction of defect features. A package, semi-finished product of textile industry, usually has cricross background. This study aims to classify four types of package defects, which are wound-in waste, spillover, cobwebs, and dirt. We use a well-known supervised attention-neural-network architecture to classify the four types of package defects effectively. In this study, we use three steps to decide the best strategies. First, we find the best location of channel attention blocks for the deep attention network. After that, we compare two image preprocessing methods to enhance the features of defect. To understand if regularize the background trend will improve the performance or not, we create two kinds of dataset, rotated and non-rotated. Our study improves traditional AOI methods. The experimental results show that the proposed procedures can extract the package defects with interlacing background efficiently.
AB - Nowadays, automatic optical inspection (AOI) has been widely used in advanced manufactory. In AOI area, crisscross background may influence extraction of defect features. A package, semi-finished product of textile industry, usually has cricross background. This study aims to classify four types of package defects, which are wound-in waste, spillover, cobwebs, and dirt. We use a well-known supervised attention-neural-network architecture to classify the four types of package defects effectively. In this study, we use three steps to decide the best strategies. First, we find the best location of channel attention blocks for the deep attention network. After that, we compare two image preprocessing methods to enhance the features of defect. To understand if regularize the background trend will improve the performance or not, we create two kinds of dataset, rotated and non-rotated. Our study improves traditional AOI methods. The experimental results show that the proposed procedures can extract the package defects with interlacing background efficiently.
KW - attention-neural-network architecture
KW - defects detection
KW - textile industry
UR - http://www.scopus.com/inward/record.url?scp=85100024954&partnerID=8YFLogxK
U2 - 10.1109/ICPAI51961.2020.00053
DO - 10.1109/ICPAI51961.2020.00053
M3 - 會議論文篇章
AN - SCOPUS:85100024954
T3 - Proceedings - 2020 International Conference on Pervasive Artificial Intelligence, ICPAI 2020
SP - 246
EP - 252
BT - Proceedings - 2020 International Conference on Pervasive Artificial Intelligence, ICPAI 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1st International Conference on Pervasive Artificial Intelligence, ICPAI 2020
Y2 - 3 December 2020 through 5 December 2020
ER -