TSG - A test system generator for debugging and regression test of high-level behavioral synthesis tools

R. Ernst, S. Sutarwala, J. Y. Jou

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

The authors present a simulation-based system for testing high-level behavioral synthesis tools. Applications are tool debugging and automatic regression test. A key feature is a transformation of sequential circuits for application of random test patterns.

原文???core.languages.en_GB???
主出版物標題20 Int Test Conf 1989 ITC
編輯 Anon
發行者Publ by IEEE
頁面937
頁數1
ISBN(列印)0818689625
出版狀態已出版 - 1989
事件20th International Test Conference 1989 (ITC) - Washington, DC, USA
持續時間: 29 8月 198931 8月 1989

出版系列

名字20 Int Test Conf 1989 ITC

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???20th International Test Conference 1989 (ITC)
城市Washington, DC, USA
期間29/08/8931/08/89

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