Trap-profile extraction using high-voltage capacitance-voltage measurement in AlGaN/GaN heterostructure field-effect transistors with field plates

Wen Chia Liao, Jen Inn Chyi, Yue Ming Hsin

研究成果: 雜誌貢獻期刊論文同行評審

14 引文 斯高帕斯(Scopus)

指紋

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Engineering & Materials Science

Chemical Compounds