This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.
|頁（從 - 到）||1888-1893|
|期刊||IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems|
|出版狀態||已出版 - 10月 2007|