Transparent-test methodologies for random access memories without/with ECC

Jin Fu Li

doi:10.1109/TCAD.2007.895772

Transparent-test methodologies for random access memories without/with ECC

Jin Fu Li

電機工程學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

8 引文斯高帕斯（Scopus）

摘要

This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log₂ B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log₂ B + 2)N.

原文	???core.languages.en_GB???
頁（從 - 到）	1888-1893
頁數	6
期刊	IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
卷	26
發行號	10
DOIs	https://doi.org/10.1109/TCAD.2007.895772
出版狀態	已出版 - 10月 2007

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10.1109/TCAD.2007.895772

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@article{5278bdd7e710494d9d7d967867137ded,

title = "Transparent-test methodologies for random access memories without/with ECC",

abstract = "This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.",

keywords = "Error-correction code (ECC), March test, Random-access memory (RAM), Reliability, Soft errors, Transparent test",

author = "Li, {Jin Fu}",

note = "Funding Information: Manuscript received August 31, 2006; revised December 3, 2006. This work was supported in part by the National Science Council, Taiwan, R.O.C., under Contract NSC 95-2221-E-008-152 and in part by MOEA, Taiwan, R.O.C., under Contract 96-EC-17-A-01-S1-002. This paper was recommended by Associate Editor K. Chakrabarty.",

year = "2007",

month = oct,

doi = "10.1109/TCAD.2007.895772",

language = "???core.languages.en_GB???",

volume = "26",

pages = "1888--1893",

journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",

issn = "0278-0070",

number = "10",

}

TY - JOUR

T1 - Transparent-test methodologies for random access memories without/with ECC

AU - Li, Jin Fu

N1 - Funding Information: Manuscript received August 31, 2006; revised December 3, 2006. This work was supported in part by the National Science Council, Taiwan, R.O.C., under Contract NSC 95-2221-E-008-152 and in part by MOEA, Taiwan, R.O.C., under Contract 96-EC-17-A-01-S1-002. This paper was recommended by Associate Editor K. Chakrabarty.

PY - 2007/10

Y1 - 2007/10

N2 - This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.

AB - This paper presents a systematic procedure for transforming a bit-oriented March test into a transparent word-oriented March test. The test-time complexity of the transparent word-oriented March tests converted by the proposed method is only (P + 5 log2 B + 2) N for an N × B-bit Random Access Memory, and the test-time complexity of the corresponding signature-prediction test is QN. Here, P and Q denote the number of total Read/Write and Read test operations of the original bit-oriented March test. A transparent-test methodology for memories with error-correction code (ECC) is also proposed. This methodology can test and locate faulty cells, and no signature prediction is needed. The test-time complexity of the proposed transparent-test methodology for memories with ECC is only (P + 5 log2 B + 2)N.

KW - Error-correction code (ECC)

KW - March test

KW - Random-access memory (RAM)

KW - Reliability

KW - Soft errors

KW - Transparent test

UR - http://www.scopus.com/inward/record.url?scp=34748836885&partnerID=8YFLogxK

U2 - 10.1109/TCAD.2007.895772

DO - 10.1109/TCAD.2007.895772

M3 - 期刊論文

AN - SCOPUS:34748836885

SN - 0278-0070

VL - 26

SP - 1888

EP - 1893

JO - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

JF - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

IS - 10

ER -

Transparent-test methodologies for random access memories without/with ECC

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