Timing-Driven Partial Scan

This partial scan approach reduces area overhead and performance degradation caused by test logic. Given an initial design that meets a target speed, the authors' algorithm selects a set of scan flip-flops that allows the circuit to meet performance requirements after the scan logic is added. If no such set exists, the algorithm selects a set that minimizes the total area increase caused by the scan logic and the subsequent performance optimization the circuit requires to meet target speed.