摘要
An electric-field-induced second-harmonic-generation signal in a nematic liquid crystal is used to map the electric field in an integrated-circuit-like sample. Since the electric-field-induced second-harmonic-generation signal intensity exhibits a strong dependence on the polarization of the incident laser beam, both the amplitude and the orientation of the electric field vectors can be measured. Combined with scanning second-harmonic-generation microscopy, three-dimensional electric field distribution can be easily visualized with high spatial resolution of the order of 1 μm.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 頁（從 - 到） | 1338-1340 |
| 頁數 | 3 |
| 期刊 | Optics Letters |
| 卷 | 28 |
| 發行號 | 15 |
| DOIs | |
| 出版狀態 | 已出版 - 1 8月 2003 |