摘要
The thickness dependence of strain distribution renormalization on self-organized InAs quantum dots was systematically studied. The photoluminescence (PL) characteristics exhibit that the strain energy between quantum dots (QDs) and wetting layer (WL) is redistributed as the InAs deposition thickness changes. By the temperature dependence of emission energy shift, the dots exhibit the more InAs-like behaviors, while increasing the InAs deposition thickness.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 1125-1127 |
頁數 | 3 |
期刊 | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
卷 | 20 |
發行號 | 3 |
DOIs | |
出版狀態 | 已出版 - 5月 2002 |