The understanding of the trap induced variation in bulk tri-gate devices by a novel Random Trap Profiling (RTP) technique

H. M. Tsai, E. R. Hsieh, Steve S. Chung, C. H. Tsai, R. M. Huang, C. T. Tsai, C. W. Liang

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

13 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering