The true‐height analysis of ionograms using simplified numerical procedures

L. ‐C Tsai, F. T. Berkey, G. S. Stiles

研究成果: 雜誌貢獻期刊論文同行評審

6 引文 斯高帕斯(Scopus)

摘要

In this paper a numerical integration method termed “μ't fitting” for application to the true‐height analysis of digitally recorded ionograms is introduced. This method can be used to analyze either the O or X waves in an ionogram and includes the effect of the Earth's magnetic field. For the second order polynomial profile analysis the μ't fitting technique utilizes 38–62% fewer numerical operations than the Gaussian quadrature integration method. Applying 5‐ (12‐) term μ' t fitting to 100 data points, the method completes a true‐height analysis in 0.77 (1.43) s, using an 80486/33 computer system. Furthermore, applying this technique to the overlapping Chapman model profile adopted by Union Radio Scientifique Internationale (URSI) Working Group G.6.2 (McNamara and Titheridge, 1977) yields rms errors of 8.3 and 7.0 meters for the O and X wave components (12‐term μ't fitting), over a set of 22 selected frequencies.

原文???core.languages.en_GB???
頁(從 - 到)949-959
頁數11
期刊Radio Science
30
發行號4
DOIs
出版狀態已出版 - 1995

指紋

深入研究「The true‐height analysis of ionograms using simplified numerical procedures」主題。共同形成了獨特的指紋。

引用此