The measurement of the misalignment induced aberration of a miniature lens

Hung Sheng Chang, Chao Wen Liang

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

摘要

The manufacturing errors of an optical system are in different types of tolerance categories. Among these tolerance categories, the optical surface figure error and the surface / element alignment errors are the two most important factors in determining the optical system performance. In the large optics, the optical surface figure error is typically the dominating factor while the alignment are, for most of time, the most critical factor in the miniature optics. However, the optical testing of the miniature optics alignment is difficult and sometimes nearly impossible to be achieved properly. The misaligned lens element induce the unsymmetrical optical aberration spanning throughout the optical field. This type of aberrations usually dominates near the edge of the field if the misalignment is near its tolerance limit. We proposed a novel method utilizing an ultra-high dynamic range wavefront sensor (UHDR-WFS) to measure the off-axis aberrations of a miniature lens near its field edge. The unsymmetrical aberration is measured by spin-scanning the optical field of the tested miniature lens along the azimuthal direction. A F/2.0 optical beam out of a miniature lens is measured directly without using any collimator. The preliminary test result showing that the constant coma aberration are the dominating aberration of a misaligned miniature lens. The measurement result does matches our expectation from the simulation in the ray tracing software.

原文???core.languages.en_GB???
主出版物標題Optical System Alignment, Tolerancing, and Verification XII
編輯Jose Sasian, Richard N. Youngworth
發行者SPIE
ISBN(電子)9781510620650
DOIs
出版狀態已出版 - 2018
事件Optical System Alignment, Tolerancing, and Verification XII 2018 - San Diego, United States
持續時間: 19 8月 201820 8月 2018

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
10747
ISSN(列印)0277-786X
ISSN(電子)1996-756X

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???event.eventtypes.event.conference???Optical System Alignment, Tolerancing, and Verification XII 2018
國家/地區United States
城市San Diego
期間19/08/1820/08/18

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