The failure mechanisms and phase formation for Ni, Co and Cu contacts on ion implanted (0 0 1)Si under high current stress

H. H. Lin, S. L. Cheng, L. J. Chen

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

指紋

深入研究「The failure mechanisms and phase formation for Ni, Co and Cu contacts on ion implanted (0 0 1)Si under high current stress」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy