The development of synchrotron-assisted scanning probe microscopy at NSRRC

Synchrotron-based X-ray microspectroscopy is a technique that brings together microscopy and X-ray spectroscopy. It can be considered as an experimental approach capable of extracting X-ray spectrum from a finite area, or an alternative way of constructing images with spectroscopic contrast. The goal of this project is to integrate the functions of scanning tunnelling electron microscope (STM) with near edge X-ray absorption fine structure (NEXAFS) spectroscopy. Here, we describe our experimental setup, followed by recent results that demonstrate the feasibility of acquiring NEXAFS spectrum with a SiO₂ coated STM tip.