The development of synchrotron-assisted scanning probe microscopy at NSRRC

Yuet Loy Chan, Xihui Liang, Tsung Hsuan Wu, Dah An Lu, Meng Fan Luo, Yao Jane Hsu, D. H. Wei

研究成果: 雜誌貢獻會議論文同行評審

3 引文 斯高帕斯(Scopus)


Synchrotron-based X-ray microspectroscopy is a technique that brings together microscopy and X-ray spectroscopy. It can be considered as an experimental approach capable of extracting X-ray spectrum from a finite area, or an alternative way of constructing images with spectroscopic contrast. The goal of this project is to integrate the functions of scanning tunnelling electron microscope (STM) with near edge X-ray absorption fine structure (NEXAFS) spectroscopy. Here, we describe our experimental setup, followed by recent results that demonstrate the feasibility of acquiring NEXAFS spectrum with a SiO2 coated STM tip.

期刊Journal of Physics: Conference Series
出版狀態已出版 - 2013
事件11th International Conference on X-Ray Microscopy, XRM 2012 - Shanghai, China
持續時間: 5 8月 201210 8月 2012


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