The demonstration of low-cost and logic process fully-compatible OTP memory on advanced HKMG CMOS with a newly found dielectric fuse breakdown
E. R. Hsieh, Z. H. Huang, Steve S. Chung, J. C. Ke, C. W. Yang, C. T. Tsai, T. R. Yew
研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審
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引文
斯高帕斯(Scopus)