The composition of intermetallic compounds in Sn-Ag-Bi-In solders on Cu substrates

M. H. Chen, Y. Y. Jieng, Albert T. Wu

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

84Sn-3Ag-3Bi-10In and 89Sn-3Ag-3Bi-5In solders were subjected to reflow and solid state aging. The intermetallic compounds that formed at the interfaces between the solders and the Cu substrates and those that formed in the bulk solders in both test conditions were investigated. In the as-reflow samples, the intermetallic compounds were identified as Cu3Sn and Cu 6Sn5. After solid state aging, these compounds became Cu6(Sn,In)5 and Cu3(Sn,In). The compounds that formed in the bulk solders were ζ phase, the solid solution of Ag 3Sn and Ag2In.

原文???core.languages.en_GB???
主出版物標題2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008
頁面209-211
頁數3
DOIs
出版狀態已出版 - 2008
事件2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008 - Taipei, Taiwan
持續時間: 22 10月 200824 10月 2008

出版系列

名字2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008

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???event.eventtypes.event.conference???2008 3rd International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2008
國家/地區Taiwan
城市Taipei
期間22/10/0824/10/08

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