Testing ternary content addressable memories with active neighbourhood pattern-sensitive faults

Y. J. Huang, J. F. Li

研究成果: 雜誌貢獻期刊論文同行評審

8 引文 斯高帕斯(Scopus)

摘要

With shrinking transistor sizes and growing transistor density, testing neighbourhood pattern-sensitive faults (NPSFs) is increasingly important for semiconductor memories. A test methodology for detecting active NPSFs (ANPSFs) and static NPSFs (SNPSFs) in ternary content addressable memories (TCAMs) is presented. March-like and two-group test methods are two commonly used testing techniques for NPSFs in random access memories. Because of the special TCAM cell structure, however, using a unique test algorithm with only either a March-like or a two-group test operations are not time-efficient. A test methodology that employs both March-based and two-group testing to cover 100 ANPSFs and SNPSFs in TCAMs is proposed. The total test complexity of the proposed test methodology is 156N for an N×K-bit TCAM. No TCAM circuit modification is needed to support the proposed test methodology.

原文???core.languages.en_GB???
頁(從 - 到)246-255
頁數10
期刊IET Computers and Digital Techniques
1
發行號3
DOIs
出版狀態已出版 - 2007

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