Testing stuck-open faults of priority address encoder in content addressable memories

Tsai Ling Tsai, Jin Fu Li, Chun Lung Hsu, Chi Tien Su

研究成果: 書貢獻/報告類型會議論文篇章同行評審

3 引文 斯高帕斯(Scopus)

摘要

Content addressable memory (CAM) is widely used in the systems with the need of parallel search. The testing of CAM is more difficult than that of random access memory (RAM) due to the complicated function of CAM. Similar to the testing of RAM, the testing of CAM should cover the cell array and peripheral circuits. In this paper, we propose a March-like test, March-PCL, for detecting the stuck-open faults (SOFs) of the priority address encoder of CAMs. As the best of our knowledge, this is the first word to discuss the testing of SOFs of the priority address encoder of CAMs. The March-PCL requires 4N Write and 4N Compare operations to cover 100% SOFs.

原文???core.languages.en_GB???
主出版物標題ASP-DAC 2019 - 24th Asia and South Pacific Design Automation Conference
發行者Institute of Electrical and Electronics Engineers Inc.
頁面382-387
頁數6
ISBN(電子)9781450360074
DOIs
出版狀態已出版 - 21 1月 2019
事件24th Asia and South Pacific Design Automation Conference, ASPDAC 2019 - Tokyo, Japan
持續時間: 21 1月 201924 1月 2019

出版系列

名字Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

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???event.eventtypes.event.conference???24th Asia and South Pacific Design Automation Conference, ASPDAC 2019
國家/地區Japan
城市Tokyo
期間21/01/1924/01/19

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