Testing of Configurable 8T SRAMs for In-Memory Computing

Keyphrases

• Static Random Access Memory 100%
• 8T SRAM 100%
• In-memory Computing 100%
• Ternary Content Addressable Memory 60%
• Memory Wall 20%
• Write Operation 20%
• Memory Array 20%
• Comparison Faults 20%
• Testing Algorithm 20%
• Memory Cell 20%
• Computing Architecture 20%
• Memory Faults 20%
• Memory Function 20%
• Erase Operation 20%
• Von Neumann 20%
• 1-bit 20%

Computer Science

• Static Random Access Memory 100%
• ternary content addressable memory 60%
• Computer Architecture 40%
• Test Algorithm 20%
• Memory Array 20%
• Write Operation 20%
• Erase Operation 20%