每年專案
摘要
In-memory computing (IMC) architecture has been considered as an alternative for overcoming the memory wall of von-Neumann computing architecture. Various IMC memories using 8T static random access memory (SRAM) cell have been reported. Some of them, the memory array can provide SRAM and ternary content addressable memory (TCAM) function. In this paper, a March-like test algorithm is proposed, which requires 10 × 2p Read/Write operations, (2q + 4m) Compare operation, and (2r+1 + 4m) Erase operations to cover simple SRAM faults and TCAM Comparison faults, for an IMC 8T SRAM providing 2p ×w-bit SRAM and m× 2q-1-bit TCAM, where p = q+r and m = 2r ×w.
原文 | ???core.languages.en_GB??? |
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主出版物標題 | Proceedings - 2020 IEEE 29th Asian Test Symposium, ATS 2020 |
發行者 | IEEE Computer Society |
ISBN(電子) | 9781728174679 |
DOIs | |
出版狀態 | 已出版 - 23 11月 2020 |
事件 | 29th IEEE Asian Test Symposium, ATS 2020 - Penang, Malaysia 持續時間: 22 11月 2020 → 25 11月 2020 |
出版系列
名字 | Proceedings of the Asian Test Symposium |
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卷 | 2020-November |
ISSN(列印) | 1081-7735 |
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???event.eventtypes.event.conference??? | 29th IEEE Asian Test Symposium, ATS 2020 |
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國家/地區 | Malaysia |
城市 | Penang |
期間 | 22/11/20 → 25/11/20 |
指紋
深入研究「Testing of Configurable 8T SRAMs for In-Memory Computing」主題。共同形成了獨特的指紋。專案
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研究計畫: Research