Testing of Configurable 8T SRAMs for In-Memory Computing

Jin Fu Li, Tsai Ling Tsai, Chun Lung Hsu, Chi Tien Sun

研究成果: 書貢獻/報告類型會議論文篇章同行評審

4 引文 斯高帕斯(Scopus)

摘要

In-memory computing (IMC) architecture has been considered as an alternative for overcoming the memory wall of von-Neumann computing architecture. Various IMC memories using 8T static random access memory (SRAM) cell have been reported. Some of them, the memory array can provide SRAM and ternary content addressable memory (TCAM) function. In this paper, a March-like test algorithm is proposed, which requires 10 × 2p Read/Write operations, (2q + 4m) Compare operation, and (2r+1 + 4m) Erase operations to cover simple SRAM faults and TCAM Comparison faults, for an IMC 8T SRAM providing 2p ×w-bit SRAM and m× 2q-1-bit TCAM, where p = q+r and m = 2r ×w.

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主出版物標題Proceedings - 2020 IEEE 29th Asian Test Symposium, ATS 2020
發行者IEEE Computer Society
ISBN(電子)9781728174679
DOIs
出版狀態已出版 - 23 11月 2020
事件29th IEEE Asian Test Symposium, ATS 2020 - Penang, Malaysia
持續時間: 22 11月 202025 11月 2020

出版系列

名字Proceedings of the Asian Test Symposium
2020-November
ISSN(列印)1081-7735

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???event.eventtypes.event.conference???29th IEEE Asian Test Symposium, ATS 2020
國家/地區Malaysia
城市Penang
期間22/11/2025/11/20

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