TY - GEN
T1 - Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs
AU - Li, Jin Fu
PY - 2005
Y1 - 2005
N2 - With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware mod-ulars. Content addressable memories (CAMs) play an important rote in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N Write operations, 2N Erase operations, and (3N+2B) Compare operations for an N×B-bit TCAM.
AB - With the increasing demand for high-performance networking application, network components such as network interfaces and routers are built in dedicated hardware mod-ulars. Content addressable memories (CAMs) play an important rote in the network components. Testing CAMs is very complicated due to their special structure. This paper presents an efficient March-like test algorithm for detecting the comparison faults of ternary CAMs based on the comparison fault models of binary CAMs. The test algorithm requires 5N Write operations, 2N Erase operations, and (3N+2B) Compare operations for an N×B-bit TCAM.
UR - http://www.scopus.com/inward/record.url?scp=33847131248&partnerID=8YFLogxK
U2 - 10.1145/1120725.1120745
DO - 10.1145/1120725.1120745
M3 - 會議論文篇章
AN - SCOPUS:33847131248
SN - 0780387368
SN - 9780780387362
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 65
EP - 70
BT - Proceedings of the 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2005 Asia and South Pacific Design Automation Conference, ASP-DAC 2005
Y2 - 18 January 2005 through 21 January 2005
ER -