@inproceedings{a31008ccf25e4d27b9c7a89f0844676b,
title = "Testing and Reliability of Computing-In Memories: Solutions and Challenges",
abstract = "Various computing-in-memory designs have been proposed as a possible computing architecture for the data-centric computing applications. Existing memories such as random access memories, flash memories, and emerging memories can be modified as computing-in-memories (CIMs) to support computing operations. In CIMs, computing operations typically are more complex and have smaller sensing margin than the read operation. Furthermore, storage devices of emerging memories are more unreliable than transistors. Those make the testing and reliability of CIMs become worse. In this paper, we first review existing testing and reliability-enhancement methods for CIMs. Then, testing and reliability challenges of CIMs are discussed.",
keywords = "RAM, RRNM, STT-MRAM, computing in memory, reliability, test",
author = "Li, {Jin Fu}",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 6th IEEE International Test Conference in Asia, ITC-Asia 2022 ; Conference date: 24-08-2022 Through 26-08-2022",
year = "2022",
doi = "10.1109/ITCAsia55616.2022.00020",
language = "???core.languages.en_GB???",
series = "Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "55--60",
booktitle = "Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022",
}