Testing and Reliability of Computing-In Memories: Solutions and Challenges

Jin Fu Li

doi:10.1109/ITCAsia55616.2022.00020

Testing and Reliability of Computing-In Memories: Solutions and Challenges

Jin Fu Li

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

6 引文斯高帕斯（Scopus）

摘要

Various computing-in-memory designs have been proposed as a possible computing architecture for the data-centric computing applications. Existing memories such as random access memories, flash memories, and emerging memories can be modified as computing-in-memories (CIMs) to support computing operations. In CIMs, computing operations typically are more complex and have smaller sensing margin than the read operation. Furthermore, storage devices of emerging memories are more unreliable than transistors. Those make the testing and reliability of CIMs become worse. In this paper, we first review existing testing and reliability-enhancement methods for CIMs. Then, testing and reliability challenges of CIMs are discussed.

原文	???core.languages.en_GB???
主出版物標題	Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	55-60
頁數	6
ISBN（電子）	9781665455237
DOIs	https://doi.org/10.1109/ITCAsia55616.2022.00020
出版狀態	已出版 - 2022
事件	6th IEEE International Test Conference in Asia, ITC-Asia 2022 - Taipei, Taiwan 持續時間: 24 8月 2022 → 26 8月 2022

出版系列

名字	Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	6th IEEE International Test Conference in Asia, ITC-Asia 2022
國家/地區	Taiwan
城市	Taipei
期間	24/08/22 → 26/08/22

存取文件

10.1109/ITCAsia55616.2022.00020

應用於運算記憶體之前瞻可靠度及測試框架-總計畫暨子計畫一：應用於運算記憶體之測試技術
Li, J.-F. (PI)
1/08/22 → 31/07/23
研究計畫: Research

引用此

Li, J. F. (2022). Testing and Reliability of Computing-In Memories: Solutions and Challenges. 於 Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022 (頁 55-60). (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ITCAsia55616.2022.00020

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title = "Testing and Reliability of Computing-In Memories: Solutions and Challenges",

abstract = "Various computing-in-memory designs have been proposed as a possible computing architecture for the data-centric computing applications. Existing memories such as random access memories, flash memories, and emerging memories can be modified as computing-in-memories (CIMs) to support computing operations. In CIMs, computing operations typically are more complex and have smaller sensing margin than the read operation. Furthermore, storage devices of emerging memories are more unreliable than transistors. Those make the testing and reliability of CIMs become worse. In this paper, we first review existing testing and reliability-enhancement methods for CIMs. Then, testing and reliability challenges of CIMs are discussed.",

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Li, JF 2022, Testing and Reliability of Computing-In Memories: Solutions and Challenges. 於 Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022, Institute of Electrical and Electronics Engineers Inc., 頁 55-60, 6th IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, 24/08/22. https://doi.org/10.1109/ITCAsia55616.2022.00020

Testing and Reliability of Computing-In Memories: Solutions and Challenges. / Li, Jin Fu.
Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022. Institute of Electrical and Electronics Engineers Inc., 2022. p. 55-60 (Proceedings - 2022 IEEE International Test Conference in Asia, ITC-Asia 2022).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

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Testing and Reliability of Computing-In Memories: Solutions and Challenges

摘要

出版系列

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指紋

專案

應用於運算記憶體之前瞻可靠度及測試框架-總計畫暨子計畫一：應用於運算記憶體之測試技術

引用此