@inproceedings{bb9bac6d605248ed8d4c865fe60d9148,
title = "Testing active neighborhood pattern-sensitive faults of ternary content addressable memories",
abstract = "With the shrinking feature size and the growing density, testing neighborhood pattern-sensitive faults (NPSFs) of integrated circuits is more and more important, especially testing NPSFs of semiconductor memories. This paper presents a test algorithm for detecting the active NPSFs (ANPSFs) in ternary content addressable memories (TCAMs). Due to the special TCAM cell structure, unique test algorithm with only march-based test operations or only two-group test operations is not efficient. We propose a test methodology with both march-based and two-group tests to cover 100% ANPSFs in TCAMs. The total test complexity is 156N for an N×K-bit TCAM. Also, no TCAM circuit modification is needed to support the proposed test methodology.",
author = "Huang, {Yu Jen} and Li, {Jin Fu}",
year = "2006",
doi = "10.1109/ETS.2006.46",
language = "???core.languages.en_GB???",
isbn = "0769525660",
series = "Proceedings - Eleventh IEEE European Test Symposium, ETS 2006",
pages = "55--60",
booktitle = "Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006",
note = "11th IEEE European Test Symposium, ETS 2006 ; Conference date: 21-05-2006 Through 21-05-2006",
}