Testable and fault tolerant design for FFT networks

Keyphrases

• Fast Fourier Transform 100%
• Transform Network 100%
• Fault-tolerant Design 100%
• Test Pattern 20%
• Low Computational Complexity 20%
• 16-bit 20%
• Hardware Overhead 20%
• Reconfiguration 20%
• Combinational 20%
• Stuck-at 20%
• Cell Design 20%
• Subtract 20%
• Network Size 20%
• Specialized Cell 20%
• High Reliability 20%
• Bit Level 20%
• C-testability 20%

Computer Science

• Fault Tolerant 100%
• Fast Fourier Transform 100%
• Hardware Overhead 40%
• Reconfiguration 20%
• High Reliability 20%

Engineering

• Fast Fourier Transform 100%
• Hardware Overhead 40%
• Interconnects 20%
• Reconfiguration 20%
• Cell Design 20%
• Bit Number 20%