@inproceedings{bc7791cae15b47a6a16a9e1bc96d23c7,
title = "Testable and fault tolerant design for FFT networks",
abstract = "We propose a novel C-testable technique for the fast-Fourier-transform (FFT) networks. Only 18 test patterns are required to achieve 100% coverage of combinational single cell faults and interconnect stuck-at faults for the FFT network. A fault tolerant design for the FFT network also has been proposed. Compared with previous results, our approach has higher reliability and lower hardware overhead-only three spare bit-level cells are needed for repairing a faulty row in the multiply-subtract-add (MSA) module, and special cell design is not required to implement the reconfiguration scheme. The hardware overhead is low-about 4% for 16-bit numbers regardless of the FFT network size.",
author = "Li, {Jin Fu} and Wu, {Cheng Wen}",
note = "Publisher Copyright: {\textcopyright} 1999 IEEE.; 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999 ; Conference date: 01-11-1999 Through 03-11-1999",
year = "1999",
doi = "10.1109/DFTVS.1999.802886",
language = "???core.languages.en_GB???",
series = "Proceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "201--209",
booktitle = "Proceedings - 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 1999",
}