@inproceedings{9b6d4cd3c06e457caa64e3b30bc12365,
title = "Study on Reduction of Background Fringes for Defect Detection of Specular Surface",
abstract = "For the defect detection of specular surfaces, the image of the light source and other images of surrounding objects tend to be recorded, increasing the complexity of recognition. The method of combined dark-and-bright field illumination has been shown to improve the image quality of the defects on specular surfaces. However, there is still an issue of background fringes. In this study, we design a compensating pattern for diminishing the background fringes. The experimental results show that the proposed method can effectively dilute these fringes and increase the detection efficiency by fewer capture images.",
author = "Wei, {An Chi} and Chang, {Yi Cheng} and Sze, {Jyh Rou}",
note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 Asia Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2023 ; Conference date: 31-10-2023 Through 03-11-2023",
year = "2023",
doi = "10.1109/APSIPAASC58517.2023.10317452",
language = "???core.languages.en_GB???",
series = "2023 Asia Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2163--2167",
booktitle = "2023 Asia Pacific Signal and Information Processing Association Annual Summit and Conference, APSIPA ASC 2023",
}