Study of 1/f and 1/f2 noise for InP DHBT

Kurt Cimino, Yue Ming Hsin, S. C. Shen, Milton Feng

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

This work reports experimental data comparing the low frequency noise spectrum of InP based HBTs. Double heterojunction device structures are examined with and without surface passivation ledges.

原文???core.languages.en_GB???
主出版物標題2005 International Conference on Compound Semiconductor Manufacturing Technology
出版狀態已出版 - 2005
事件2005 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2005 - New Orleans, LA, United States
持續時間: 11 4月 200514 4月 2005

出版系列

名字2005 International Conference on Compound Semiconductor Manufacturing Technology

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???2005 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2005
國家/地區United States
城市New Orleans, LA
期間11/04/0514/04/05

指紋

深入研究「Study of 1/f and 1/f2 noise for InP DHBT」主題。共同形成了獨特的指紋。

引用此