Specific series resistance evaluation using photoluminescence signal of Si solar cells

Te Yuan Chung; Ying Chang Chung; Sheng Hui Chen

doi:10.1364/OE.20.00A822

Specific series resistance evaluation using photoluminescence signal of Si solar cells

Te Yuan Chung, Ying Chang Chung, Sheng Hui Chen

光電科學與工程學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2 引文斯高帕斯（Scopus）

摘要

A new method is introduced to evaluate the specific series resistance distribution of solar cells using photoluminescence images under both short circuit and open circuit conditions. An experiment was perfomed to confirm that method is insensitive to the illumination intensity distribution and valid for different illumination levels.

原文	???core.languages.en_GB???
頁（從 - 到）	A822-A827
期刊	Optics Express
卷	20
發行號	106
DOIs	https://doi.org/10.1364/OE.20.00A822
出版狀態	已出版 - 5 11月 2012

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10.1364/OE.20.00A822

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AU - Chung, Ying Chang

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N2 - A new method is introduced to evaluate the specific series resistance distribution of solar cells using photoluminescence images under both short circuit and open circuit conditions. An experiment was perfomed to confirm that method is insensitive to the illumination intensity distribution and valid for different illumination levels.

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JO - Optics Express

JF - Optics Express

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Specific series resistance evaluation using photoluminescence signal of Si solar cells

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