Solvent effects on chain orientation and interchain π-interaction in conjugated polymer thin films: Direct measurements of the air and substrate interfaces by near-edge X-ray absorption spectroscopy

Peter K.H. Ho, Lay Lay Chua, Mandai Dipankar, Xingyu Gao, Dongchen Qi, Andrew T.S. Wee, Jui Fen Chang, Richard H. Friend

研究成果: 雜誌貢獻期刊論文同行評審

101 引文 斯高帕斯(Scopus)

摘要

Near-edge x-ray absorption fine-structure spectroscopy (NEXAFS) was applied to investigate polymer structures and show that NEXAFS band shapes and intensities are also insensitive to the intermolecular π-interaction in regioregular poly(3-hexylthiophene) films. Delamination was used to expose the substrate interface and it was found that the interchain π-interaction was dependent on the deposition solvent quality. Direct imaging by friction-mode atomic force microscopy (AFM) revealed the expected presence of a mosaic surface morphology with a finer length scale than surface topography. The ability to directly measure chain segmental orientation and interaction at the interfaces could lead to a systematic optimization for even higher device performance. The results show that a strong modification of the NEXAFS spectra was observed and related to π-π interactions between chain segments.

原文???core.languages.en_GB???
頁(從 - 到)215-221
頁數7
期刊Advanced Materials
19
發行號2
DOIs
出版狀態已出版 - 20 1月 2007

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