The multifunctional snapshot angle-resolved spectroscopy (ARS) system capable of electro-luminescence, photoluminescence, and reflectance measurements for thin film devices is developed based on the k-space imaging technique. Compared with the conventional goniometric ARS system, this snapshot spectroscopy system offers great advantages of rapid and simple measurement, suitable for characterizing thin film devices that are unstable or degraded under long-time or high-power driving conditions, such as OLEDs. We perform a detailed calibration of the snapshot system and show that the measured results closely match with those obtained using a goniometric system. Furthermore, we show the capabilities of the system with application in studying polariton OLEDs. The result provides comprehensive information on the polariton mode dispersion and emission distribution, and shows an effective radiative pumping of the lower polariton branch for high emission efficiency.