Si1−xGex photodiode with segregated Ge nanocrystals

Yao Tsung Ouyang, Hsien Chien Hsieh, Po Chen Lin, Tsan Hsien Tseng, Ching Shun Ku, Hsin Yi Lee, Albert T. Wu

研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)

摘要

P-N junction diodes with excellent rectifying characteristics were prepared by segregating the Ge nanocrystals of Si1−xGex thin films deposited by co-sputtering. The current-voltage characteristics in darkness and under illumination were studied. The correlation between the p-n junction performance and the microstructure of the films is discussed, and the rectifying property became stronger as the fraction of Ge in the Si1−xGex films increased. The optical bandgap can be tuned by controlling the grain size in Ge and SiGe nanocrystals. The graded structure of the Si1−xGex photodiode is proposed to widen the light absorption region. The concept can be used to design high-efficiency photodiodes.

原文???core.languages.en_GB???
頁(從 - 到)308-311
頁數4
期刊Materials Letters
184
DOIs
出版狀態已出版 - 1 12月 2016

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