Simultaneous measurement of the full-field aberration

Chao Wen Liang, Pen I. Liao

研究成果: 書貢獻/報告類型會議論文篇章同行評審

摘要

A modified grating-slit test is shown to measure the full-field aberration at multi fields simultaneously by adding a slit-lens matching array. Experimental results shows sensitivity to observe changing off-axis aberration of a tilt lens.

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主出版物標題Optical Fabrication and Testing, OFT 2010
出版狀態已出版 - 2010
事件Optical Fabrication and Testing, OFT 2010 - Jackson Hole, WY, United States
持續時間: 13 6月 201017 6月 2010

出版系列

名字Optics InfoBase Conference Papers
ISSN(電子)2162-2701

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???event.eventtypes.event.conference???Optical Fabrication and Testing, OFT 2010
國家/地區United States
城市Jackson Hole, WY
期間13/06/1017/06/10

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