SiC structural characterization by non destructive near-field microscopy techniques

Kuan Ting Wu, Enora Vuillermet, Elise Usureau, Youssef El-Helou, Michel Kazan, Wei Yen Woon, Mihai Lazar, Aurelien Bruyant

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

指紋

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Keyphrases

Engineering