Sequential redundant fault identification scheme and its application to test generation

Hsing Chung Liang; Chung Len Lee; Jwu E. Chen

Sequential redundant fault identification scheme and its application to test generation

Hsing Chung Liang, Chung Len Lee, Jwu E. Chen

電機工程學系

研究成果: 雜誌貢獻 › 會議論文 › 同行評審

5 引文斯高帕斯（Scopus）

摘要

This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated into a test generation system and the results show that it is very efficient in identifying redundant faults and improving the efficiency of a test generation system.

原文	???core.languages.en_GB???
頁（從 - 到）	57-62
頁數	6
期刊	Proceedings of the Asian Test Symposium
出版狀態	已出版 - 1994
事件	Proceedings of the 3rd Asian Test Symposium - Nara, Jpn 持續時間: 15 11月 1994 → 17 11月 1994

引用此

@article{5851cb7e70a94252aab6a4388050f25b,

title = "Sequential redundant fault identification scheme and its application to test generation",

abstract = "This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated into a test generation system and the results show that it is very efficient in identifying redundant faults and improving the efficiency of a test generation system.",

author = "Liang, {Hsing Chung} and Lee, {Chung Len} and Chen, {Jwu E.}",

year = "1994",

language = "???core.languages.en_GB???",

pages = "57--62",

journal = "Proceedings of the Asian Test Symposium",

issn = "1081-7735",

note = "Proceedings of the 3rd Asian Test Symposium ; Conference date: 15-11-1994 Through 17-11-1994",

}

TY - JOUR

T1 - Sequential redundant fault identification scheme and its application to test generation

AU - Liang, Hsing Chung

AU - Lee, Chung Len

AU - Chen, Jwu E.

PY - 1994

Y1 - 1994

N2 - This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated into a test generation system and the results show that it is very efficient in identifying redundant faults and improving the efficiency of a test generation system.

AB - This work presents an efficient method to identify sequential redundant faults. The method is based on a simple procedure to identify the flip-flops which cannot be initialized and the circuit lines which cannot be controlled to definite values. The redundant faults are classified into four types and the method can identify each type of them. The method has been experimentally incorporated into a test generation system and the results show that it is very efficient in identifying redundant faults and improving the efficiency of a test generation system.

UR - http://www.scopus.com/inward/record.url?scp=0028697741&partnerID=8YFLogxK

M3 - 會議論文

AN - SCOPUS:0028697741

SN - 1081-7735

SP - 57

EP - 62

JO - Proceedings of the Asian Test Symposium

JF - Proceedings of the Asian Test Symposium

T2 - Proceedings of the 3rd Asian Test Symposium

Y2 - 15 November 1994 through 17 November 1994

ER -

Sequential redundant fault identification scheme and its application to test generation

摘要

指紋

引用此