每年專案
摘要
Achieving self-powered photodetection without biasing is a notable challenge for photodetectors. In this work, we demonstrate the successful fabrication of large-scale van der Waals epitaxial molybdenum disulfide (MoS2) on a p-GaN/sapphire substrate using a straightforward chemical vapor deposition (CVD) technique. Our research primarily centers on the characterization of these photodetectors produced through this method. The MoS2/GaN heterojunction photodetector showcases a broad and extensive photoresponse spanning from ultraviolet A (UVA) to near-infrared (NIR). When illuminated by a 532 nm laser, its self-powered photoresponse is characterized by a rise time (τr) of ∼18.5 ms and a decay time (τd) of ∼123.2 ms. The photodetector achieves a responsivity (R) of ∼0.13 A W−1 and a specific detectivity (D*) of ∼3.8 × 1010 Jones at zero bias. Additionally, while utilizing a 404 nm laser, the photodetector reaches a maximum R and D* of ∼1.7 × 104 A/W and ∼1.6 × 1013 Jones, respectively, at Vb = 5 V. The operational mechanism of the device can be explained by the diode characteristics involving a tunneling current in the presence of reverse bias. The exceptional performance of these photodetectors can be attributed to the pristine interface between the CVD-grown MoS2 and GaN, providing an impeccably clean tunneling surface. Additionally, our investigation has unveiled that MoS2/GaN heterostructure photodetectors, featuring MoS2 coverage percentages spanning from 20% to 50%, exhibit improved responsivity capabilities at an external bias voltage. As a result, this facile CVD growth technique for MoS2 photodetectors holds significant potential for large-scale production in the manufacturing industry.
原文 | ???core.languages.en_GB??? |
---|---|
頁(從 - 到) | 18233-18240 |
頁數 | 8 |
期刊 | Nanoscale |
卷 | 15 |
發行號 | 45 |
DOIs | |
出版狀態 | 已出版 - 30 10月 2023 |
指紋
深入研究「Self-powered broadband photodetection enabled by facile CVD-grown MoS2/GaN heterostructures」主題。共同形成了獨特的指紋。專案
- 1 已完成
-
低維度新穎材料、晶圓級製程與關鍵技術整合於建構前瞻半導體元件之研究-低維度新穎材料、晶圓級製程與關鍵技術整合於建構前瞻半導體元件之研究(2/2)
Su, C.-Y. (PI)
1/05/22 → 31/07/23
研究計畫: Research