Selecting the Most Reliable Design under Type-II Censored Accelerated Testing

Dong Shang Chang; Deng Yuan Huang; Sheng Tsaing Tseng

doi:10.1109/24.249592

Selecting the Most Reliable Design under Type-II Censored Accelerated Testing

Dong Shang Chang, Deng Yuan Huang, Sheng Tsaing Tseng

企業管理學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

13 引文斯高帕斯（Scopus）

摘要

Summaty & Conclusions-Accelerated life tests (ALTs) of products and materials are used to obtain reliability information within a reasonable time frame. However, there are no suitable selection rules for selecting the best product or material as a result of the ALT. Under the type-I1 censoring plan, this paper proposes a reasonable selection rule for an ALT using the Arrhenius model. The advantages of this selection rule are compared with a non-ALT selection rule by using as criteria, a) the average ratio of timesaving in life testing, and b) sample size. The tradeoff between an increased sample size and a shortened life testing time for the ALT selection procedure is feasible.

原文	???core.languages.en_GB???
頁（從 - 到）	588-592
頁數	5
期刊	IEEE Transactions on Reliability
卷	41
發行號	4
DOIs	https://doi.org/10.1109/24.249592
出版狀態	已出版 - 12月 1992

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10.1109/24.249592

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Selecting the Most Reliable Design under Type-II Censored Accelerated Testing

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