Robustness analysis of the FlexRay system through fault tree analysis

Kuen Long Leu, Yung Yuan Chen, Chin Long Wey, Jwu E. Chen

研究成果: 書貢獻/報告類型會議論文篇章同行評審

3 引文 斯高帕斯(Scopus)

摘要

The increasing importance of FlexRay systems in automotive domain inspires unceasing relative researches. One primary issue among researches is to verify the robustness of FlexRay systems either from protocol aspect or from system design aspect. However, research rarely addresses the issue that network topology selection will also cause difference in robustness. In this paper, we will illustrate how to model the robustness under various network topology adoptions by a well-known technology, fault tree analysis (FTA). Quantitative and qualitative analysis results can show the potential and suitability of FTA for modeling FlexRay systems' robustness.

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主出版物標題Proceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010
頁面30-35
頁數6
DOIs
出版狀態已出版 - 2010
事件2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010 - Qingdao, China
持續時間: 15 7月 201017 7月 2010

出版系列

名字Proceedings of 2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010

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???event.eventtypes.event.conference???2010 IEEE International Conference on Vehicular Electronics and Safety, ICVES 2010
國家/地區China
城市Qingdao
期間15/07/1017/07/10

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