TY - JOUR
T1 - RLC effects on worst-case switching pattern for on-chip buses
AU - Tu, Shang Wei
AU - Jou, Jing Yang
AU - Chang, Yao Wen
PY - 2004
Y1 - 2004
N2 - Inductance effects on on-chip interconnects have become more and more significant in today's high-speed digital circuits, especially on global interconnects such as signal buses. However, most existing works consider only RC effects, e.g., the worst-case switching pattern resulting from coupling capacitance, to develop their encoding schemes to reduce bus delay. In this paper, we show that the worst-case switching patterns that incur the largest bus delay are completely different while considering RC and RLC effects. The finding implies that existing encoding schemes based on RC model might not improve or even worsen the bus delay when inductance effects become dominant.
AB - Inductance effects on on-chip interconnects have become more and more significant in today's high-speed digital circuits, especially on global interconnects such as signal buses. However, most existing works consider only RC effects, e.g., the worst-case switching pattern resulting from coupling capacitance, to develop their encoding schemes to reduce bus delay. In this paper, we show that the worst-case switching patterns that incur the largest bus delay are completely different while considering RC and RLC effects. The finding implies that existing encoding schemes based on RC model might not improve or even worsen the bus delay when inductance effects become dominant.
UR - http://www.scopus.com/inward/record.url?scp=4344685471&partnerID=8YFLogxK
M3 - 會議論文
AN - SCOPUS:4344685471
SN - 0271-4310
VL - 2
SP - II945-II948
JO - Proceedings - IEEE International Symposium on Circuits and Systems
JF - Proceedings - IEEE International Symposium on Circuits and Systems
T2 - 2004 IEEE International Symposium on Cirquits and Systems - Proceedings
Y2 - 23 May 2004 through 26 May 2004
ER -