RLC effects on worst-case switching pattern for on-chip buses

Shang Wei Tu, Jing Yang Jou, Yao Wen Chang

研究成果: 雜誌貢獻會議論文同行評審

10 引文 斯高帕斯(Scopus)

摘要

Inductance effects on on-chip interconnects have become more and more significant in today's high-speed digital circuits, especially on global interconnects such as signal buses. However, most existing works consider only RC effects, e.g., the worst-case switching pattern resulting from coupling capacitance, to develop their encoding schemes to reduce bus delay. In this paper, we show that the worst-case switching patterns that incur the largest bus delay are completely different while considering RC and RLC effects. The finding implies that existing encoding schemes based on RC model might not improve or even worsen the bus delay when inductance effects become dominant.

原文???core.languages.en_GB???
頁(從 - 到)II945-II948
期刊Proceedings - IEEE International Symposium on Circuits and Systems
2
出版狀態已出版 - 2004
事件2004 IEEE International Symposium on Cirquits and Systems - Proceedings - Vancouver, BC, Canada
持續時間: 23 5月 200426 5月 2004

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