A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.
|頁（從 - 到）||177-184|
|期刊||Proceedings of SPIE - The International Society for Optical Engineering|
|出版狀態||已出版 - 2005|
|事件||Optical Design and Testing II - Beijing, United States|
持續時間: 8 11月 2004 → 11 11月 2004