Research and development of heterodyne dispersion meter

Shu Jen Liao, Shinn Fwu Wang, Ming Hung Chiu, Chih Wen Lai, Rong Seng Chang

研究成果: 雜誌貢獻會議論文同行評審

摘要

A heterodyne dispersion meter based on total-internal reflection effects and common-path configuration is presented. It is used to measuring the dispersion power of an optical material or component for many applications in industries. The phase difference between S and P-polarizations at the total-internal reflection condition can be extracted and measured accurately by using heterodyne interferometry. The constants of dispersion formulas built by traditional ways could be revised by this method. It has some merits, such as, high resolution and stability, easy to operate, and real-time measurement.

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文章編號30
頁(從 - 到)177-184
頁數8
期刊Proceedings of SPIE - The International Society for Optical Engineering
5638
發行號PART 1
DOIs
出版狀態已出版 - 2005
事件Optical Design and Testing II - Beijing, United States
持續時間: 8 11月 200411 11月 2004

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