Reliability Prediction Using Nondestructive Accelerated-Degradation Data: Case Study on Power Supplies

Loon Ching Tang, Dong Shang Chang

研究成果: 雜誌貢獻期刊論文同行評審

60 引文 斯高帕斯(Scopus)

摘要

This paper describes a conceptual framework for reliability evaluation from nondestructive accelerated degradation data (NADD). A numerical example of data sets from power supply units for electronic products is presented using this framework. We model NADD as a collection of stochastic processes for which the parameters depend on the stress levels. The relationship between these parameters and the associated stresses is explored using regression. The failure-time of power-supply units is modeled by the Birnbaum-Saunders distribution, for which the confidence bounds and tolerance limits can be easily obtained.

原文???core.languages.en_GB???
頁(從 - 到)562-566
頁數5
期刊IEEE Transactions on Reliability
44
發行號4
DOIs
出版狀態已出版 - 12月 1995

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