Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches

Yu Guang Chen; Ying Jing Tsai

doi:10.1109/DFT59622.2023.10313545

Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches

Yu Guang Chen, Ying Jing Tsai

電機工程學系

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

1 引文斯高帕斯（Scopus）

摘要

Computing-in-memory (CIM) has been considered as one of the promising solutions to overcome von Neumann bottleneck in the presence of data-intensive applications. Although various CIM architectures with CMOS-based and/or emerging memory devices have been proposed, the device and circuit non-idealities introduce reliability issues and cause inaccurate or even wrong computing results. In this tutorial, we attempt to introduce the source of unreliability, show the detection methods, and discuss reliability-aware CIM designs from both hardware and software perspectives for mitigating the reliability issues.

原文	???core.languages.en_GB???
主出版物標題	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
編輯	Luca Cassano, Mihalis Psarakis, Marcello Traiola, Alberto Bosio
發行者	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子）	9798350315004
DOIs	https://doi.org/10.1109/DFT59622.2023.10313545
出版狀態	已出版 - 2023
事件	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 - Juan-Les-Pins, France 持續時間: 3 10月 2023 → 5 10月 2023

出版系列

名字	Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT
ISSN（列印）	2576-1501
ISSN（電子）	2765-933X

???event.eventtypes.event.conference???

???event.eventtypes.event.conference???	36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023
國家/地區	France
城市	Juan-Les-Pins
期間	3/10/23 → 5/10/23

存取文件

10.1109/DFT59622.2023.10313545

運算記憶體之測試與可靠性增強技術-子計畫三：運算記憶體之老化偵測、緩解策略與自動化技術(3/3)
Chen, Y.-G. (PI)
1/08/25 → 31/07/26
研究計畫: Research

引用此

Chen, Y. G., & Tsai, Y. J. (2023). Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. 於 L. Cassano, M. Psarakis, M. Traiola, & A. Bosio (編輯), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023 (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DFT59622.2023.10313545

Chen, Yu Guang ; Tsai, Ying Jing. / Reliability of Computing-In-Memories : Threats, Detection Methods, and Mitigation Approaches. 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. 編輯 / Luca Cassano ; Mihalis Psarakis ; Marcello Traiola ; Alberto Bosio. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).

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title = "Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches",

abstract = "Computing-in-memory (CIM) has been considered as one of the promising solutions to overcome von Neumann bottleneck in the presence of data-intensive applications. Although various CIM architectures with CMOS-based and/or emerging memory devices have been proposed, the device and circuit non-idealities introduce reliability issues and cause inaccurate or even wrong computing results. In this tutorial, we attempt to introduce the source of unreliability, show the detection methods, and discuss reliability-aware CIM designs from both hardware and software perspectives for mitigating the reliability issues.",

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Chen, YG & Tsai, YJ 2023, Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. 於 L Cassano, M Psarakis, M Traiola & A Bosio (編輯), 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT, Institute of Electrical and Electronics Engineers Inc., 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023, Juan-Les-Pins, France, 3/10/23. https://doi.org/10.1109/DFT59622.2023.10313545

Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. / Chen, Yu Guang; Tsai, Ying Jing.
36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. 編輯 / Luca Cassano; Mihalis Psarakis; Marcello Traiola; Alberto Bosio. Institute of Electrical and Electronics Engineers Inc., 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT).

研究成果: 書貢獻/報告類型 › 會議論文篇章 › 同行評審

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N2 - Computing-in-memory (CIM) has been considered as one of the promising solutions to overcome von Neumann bottleneck in the presence of data-intensive applications. Although various CIM architectures with CMOS-based and/or emerging memory devices have been proposed, the device and circuit non-idealities introduce reliability issues and cause inaccurate or even wrong computing results. In this tutorial, we attempt to introduce the source of unreliability, show the detection methods, and discuss reliability-aware CIM designs from both hardware and software perspectives for mitigating the reliability issues.

AB - Computing-in-memory (CIM) has been considered as one of the promising solutions to overcome von Neumann bottleneck in the presence of data-intensive applications. Although various CIM architectures with CMOS-based and/or emerging memory devices have been proposed, the device and circuit non-idealities introduce reliability issues and cause inaccurate or even wrong computing results. In this tutorial, we attempt to introduce the source of unreliability, show the detection methods, and discuss reliability-aware CIM designs from both hardware and software perspectives for mitigating the reliability issues.

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A2 - Cassano, Luca

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Chen YG, Tsai YJ. Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches. 於 Cassano L, Psarakis M, Traiola M, Bosio A, 編輯, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT). doi: 10.1109/DFT59622.2023.10313545

Reliability of Computing-In-Memories: Threats, Detection Methods, and Mitigation Approaches

摘要

出版系列

???event.eventtypes.event.conference???

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指紋

專案

運算記憶體之測試與可靠性增強技術-子計畫三：運算記憶體之老化偵測、緩解策略與自動化技術(3/3)

引用此