Refractive index and thickness of coating measurement interferometer

Chao Yuan Wu, Kai Wu, Sheng Hui Chen, Cheng Chung Leea

研究成果: 書貢獻/報告類型會議論文篇章同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Refractive index and thickness of coating measurement interferometer」主題。共同形成了獨特的指紋。

Mathematics

Physics & Astronomy

Engineering & Materials Science

Chemical Compounds