Quantum electronic stability of atomically uniform films

D. A. Luh, T. Miller, J. J. Paggel, M. Y. Chou, T. C. Chiang

研究成果: 雜誌貢獻期刊論文同行評審

157 引文 斯高帕斯(Scopus)

摘要

We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N ± 1 monolayer thicknesses at temperatures around 400 kelvin. The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution to the film stability.

原文???core.languages.en_GB???
頁(從 - 到)1131-1133
頁數3
期刊Science
292
發行號5519
DOIs
出版狀態已出版 - 11 5月 2001

指紋

深入研究「Quantum electronic stability of atomically uniform films」主題。共同形成了獨特的指紋。

引用此