摘要
We have studied the structural stability of thin silver films with thicknesses of N = 1 to 15 monolayers, deposited on an Fe(100) substrate. Photoemission spectroscopy results show that films of N = 1, 2, and 5 monolayer thicknesses are structurally stable for temperatures above 800 kelvin, whereas films of other thicknesses are unstable and bifurcate into a film with N ± 1 monolayer thicknesses at temperatures around 400 kelvin. The results are in agreement with theoretical predictions that consider the electronic energy of the quantum well associated with a particular film thickness as a significant contribution to the film stability.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | 1131-1133 |
頁數 | 3 |
期刊 | Science |
卷 | 292 |
發行號 | 5519 |
DOIs | |
出版狀態 | 已出版 - 11 5月 2001 |