Quantitative analysis of EELS spectra on the growth of C60 thin film on graphite

M. F. Luo, Z. Y. Li, W. Allison

研究成果: 雜誌貢獻會議論文同行評審

6 引文 斯高帕斯(Scopus)

指紋

深入研究「Quantitative analysis of EELS spectra on the growth of C60 thin film on graphite」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds