Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption

Sheng Hui Chen; Ting Wei Chang; Hsuan Wen Wang

doi:10.1155/2012/653501

Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption

Sheng Hui Chen, Ting Wei Chang, Hsuan Wen Wang

光電科學與工程學系

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2 引文斯高帕斯（Scopus）

摘要

The absorption coefficient at 1.4eV is divided by the value at 0.9eV to obtain the factor used to judge the quality of μc-Si:H. PV device performance can be predicted by multiplying V_oc with I_scwhen using this layer as an intrinsic layer. The results show a good relationship between the quality factor and the product of open-circuit voltage and short-circuit current. However, the final efficiency is influenced by the identities of the interface in the multilayer structure.

原文	???core.languages.en_GB???
文章編號	653501
期刊	International Journal of Photoenergy
卷	2012
DOIs	https://doi.org/10.1155/2012/653501
出版狀態	已出版 - 2012

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10.1155/2012/653501

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AB - The absorption coefficient at 1.4eV is divided by the value at 0.9eV to obtain the factor used to judge the quality of μc-Si:H. PV device performance can be predicted by multiplying Voc with Iscwhen using this layer as an intrinsic layer. The results show a good relationship between the quality factor and the product of open-circuit voltage and short-circuit current. However, the final efficiency is influenced by the identities of the interface in the multilayer structure.

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Quality evaluation for microcrystalline silicon thin-film solar cells by single-layer absorption

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