摘要
The status of understanding of the behavior of hydrogen in GaN and related materials is reviewed. In particular, we discuss the amount of residual hydrogen in MOCVD-grown device structures such as heterojunction bipolar transistors, thyristors and p-i-n diodes intended for high power, high temperature applications. In these structures, the residual hydrogen originating from the growth precursors decorates Mg-doped layers and AlGaN/GaN interfaces. There is a significant difference in the diffusion characteristics and thermal stability of implanted hydrogen between n- and p-GaN, due to the stronger affinity of hydrogen to pair with acceptor dopants and possibly to the difference in H2 formation probability.
| 原文 | ???core.languages.en_GB??? |
|---|---|
| 頁(從 - 到) | W10.6.1 - W10.6.10 |
| 期刊 | Materials Research Society Symposium - Proceedings |
| 卷 | 595 |
| 出版狀態 | 已出版 - 2000 |
| 事件 | The 1999 MRS Fall Meeting - Symposium W 'GaN and Related Alloys' - Boston, MA, USA 持續時間: 28 11月 1999 → 3 12月 1999 |
指紋
深入研究「Properties and effects of hydrogen in GaN」主題。共同形成了獨特的指紋。引用此
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver