摘要
The status of understanding of the behavior of hydrogen in GaN and related materials is reviewed. In particular, we discuss the amount of residual hydrogen in MOCVD-grown device structures such as heterojunction bipolar transistors, thyristors and p-i-n diodes intended for high power, high temperature applications. In these structures, the residual hydrogen originating from the growth precursors decorates Mg-doped layers and AlGaN/GaN interfaces. There is a significant difference in the diffusion characteristics and thermal stability of implanted hydrogen between n- and p-GaN, due to the stronger affinity of hydrogen to pair with acceptor dopants and possibly to the difference in H2 formation probability.
原文 | ???core.languages.en_GB??? |
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頁(從 - 到) | W10.6.1 - W10.6.10 |
期刊 | Materials Research Society Symposium - Proceedings |
卷 | 595 |
出版狀態 | 已出版 - 2000 |
事件 | The 1999 MRS Fall Meeting - Symposium W 'GaN and Related Alloys' - Boston, MA, USA 持續時間: 28 11月 1999 → 3 12月 1999 |